IEC60335-2-9 Clause 19.101 Toaster Switch Endurance Test Device

IEC60335-2-9 Clause 19.101 Toaster Switch Endurance Test Device

Product information:

The device is used for toaster switch endurance test. It is simple, accurate, and practical, and conform to the IEC60335-2-9 clause 19.101.Toasters are operated at rated power input and under normal operation, but without bread, for six cycles of operation. The appliance is then allowed to cool to approximately room temperature. This test is carried out 500 times.

The mechanism shall operate satisfactorily and no sustained arcing shall occur. Electrical connections shall not work loose and the appliance shall withstand the electric strength test of 16.3.

Note 1: Forced cooling may be used.

Note 2: A simulated load may be necessary to operate the mechanism.

Note 3: Sub-clause 19.13 does not apply.

Toasters, loaded with the bread specified for normal operation, are operated at rated power input. The ejector mechanism is prevented from releasing and the supply is maintained to the heating elements after the timer has completed its cycle. The test is terminated after any fire has extinguished, after which any residual bread is removed from the toaster.

Technical parameters:

1. Input voltage: 220V/50Hz.

2. Test number:1~9999 times (four digit).

3. Cooling fan power: 100W.

4. Temperature detecting device: infrared thermometry system (Optional).

5. Equipped with longitudinal and transverse button. The spring is used for buffering which can protect the button from damage.

6. It is equipped with the apparatus which can automatically detect the working current of the samples. The upper limit and the lower limit of current detection can be adjusted. And there is a light for status indication.

7. Drive mode: Electric (the parts of the machine are electrically driven).

8. Time can be set separately. They are: conduction time (0~99min),power-off time (0~99min),Cooling time (0~99min)

9. Dimension: 530*670*830mm.

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IEC60335-2-9 Clause 19.101 Toaster Switch Endurance Test Device Images